MIT Researchers Develop New Method to Observe Heat Flow in Electronics

Researchers at MIT have demonstrated a novel technique to precisely measure how heat moves through multilayered materials, such as those found in computer chips. The method combines ultrafast X-rays, which penetrate multiple layers, with laser pulses to deliver heat. This approach could help scientists understand overheating issues in devices and aid in the development of more power-dense electronics for various applications, from AI to wearables.